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Cristell Maneux
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2020 – today
- 2024
- [c28]Ian O'Connor, Sara Mannaa, Alberto Bosio, Bastien Deveautour, Damien Deleruyelle, Tetiana Obukhova, Cédric Marchand, Jens Trommer, Çigdem Çakirlar, Bruno Neckel Wesling, Thomas Mikolajick, Oskar Baumgartner, Mischa Thesberg, David Pirker, Christoph Lenz, Zlatan Stanojevic, Markus Karner, Guilhem Larrieu, Sylvain Pelloquin, Konstantinous Moustakas, Jonas Müller, Giovanni Ansaloni, Alireza Amirshahi, David Atienza, Jean-Luc Rouas, Leila Ben Letaifa, Georgeta Bordeall, Charles Brazier, Chhandak Mukherjee, Marina Deng, Yifan Wang, Marc François, Houssem Rezgui, Reveil Lucas, Cristell Maneux:
FVLLMONTI: The 3D Neural Network Compute Cube $(N^{2}C^{2})$ Concept for Efficient Transformer Architectures Towards Speech-to-Speech Translation. DATE 2024: 1-6 - 2023
- [j16]C. Mukherjee
, Djeber Guendouz, Marina Deng
, H. Bertin, Antoine Bobin, Nicolas Vaissiere
, Christophe Caillaud
, Akshay M. Arabhavi
, Rimjhim Chaudhary
, Olivier Ostinelli
, Colombo R. Bolognesi
, Patrick Mounaix, Cristell Maneux
:
SPICE Modeling in Verilog-A for Photo-Response in UTC-Photodiodes Targeting Beyond-5G Circuit Design. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(9): 3045-3052 (2023) - [j15]Nil Davy
, Virginie Nodjiadjim
, Muriel Riet, Colin Mismer, Marina Deng
, Chhandak Mukherjee
, Bertrand Ardouin, Cristell Maneux
:
InP DHBT Analytical Modeling: Toward THz Transistors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(11): 4102-4111 (2023) - [c27]Yifan Wang, Chhandak Mukherjee, Houssem Rezgui, Marina Deng, Cristell Maneux, Sara Mannaa, Ian O'Connor, Jonas Müller, Sylvain Pelloquin, Guilhem Larrieu:
Electrothermal modeling of junctionless vertical Si nanowire transistors for 3D logic circuit design. ESSDERC 2023: 57-60 - 2022
- [c26]Nil Davy
, Marina Deng
, Virginie Nodjiadjim, Chhandak Mukherjee, Muriel Riet, Colin Mismer, Jérémie Renaudier, Cristell Maneux:
InP DHBT test structure optimization towards 110 GHz characterization. ESSDERC 2022: 320-323 - [c25]Arnaud Poittevin, Ian O'Connor, Cédric Marchand, Alberto Bosio, Cristell Maneux, Chhandak Mukherjee, Guilhem Larrieu, Abhishek Kumar:
A Logic Cell Design and routing Methodology Specific to VNWFET. NEWCAS 2022: 460-464 - [c24]Lucas Réveil, Chhandak Mukherjee, Cristell Maneux, Marina Deng
, François Marc, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu, Arnaud Poittevin, Ian O'Connor, Oskar Baumgartner, David Pirker:
Analysis of an Inverter Logic Cell based on 3D Vertical NanoWire Junction-Less Transistors. VLSI-SoC 2022: 1-2 - 2021
- [c23]Yen Tran, Toshihiro Nomura, Mohamed Salim Cherchali, Claire Tassin, Yann Deval, Cristell Maneux:
Investigation of 0.18μm CMOS Sensitivity to BTI and HCI Mechanisms under Extreme Thermal Stress Conditions. ATS 2021: 97-102 - [c22]Nil Davy
, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Marina Deng
, Chhandak Mukherjee, Jérémie Renaudier, Cristell Maneux:
0.4-μm InP/InGaAs DHBT with a 380-GHz ${f_{T}}$, > 600-GHz $f_{\max}$ and BVCE0 > 4.5 V. BCICTS 2021: 1-4 - [c21]Marina Deng
, Chhandak Mukherjee, Nil Davy
, Virginie Nodjiadjim, Muriel Riet, Colin Mismer, Jérémie Renaudier, Magali De Matos, Cristell Maneux:
InP DHBT Characterization up to 500 GHz and Compact Model Validation Towards THz Circuit Design. BCICTS 2021: 1-4 - [c20]Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng
, Marine Couret
, François Marc, Cristell Maneux, Thomas Zimmer:
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. BCICTS 2021: 1-7 - [c19]Christophe Caillaud
, H. Bertin, Antoine Bobin, R. Gnanamani, Nicolas Vaissiere, Frédéric Pommereau, Jean Decobert, Cristell Maneux:
Ultra Compact High responsivity Photodiodes for >100 Gbaud Applications. ECOC 2021: 1-4 - [c18]C. Mukherjee, Marine Couret, Cristell Maneux, Didier Céli:
Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology. ESSDERC 2021: 251-254 - 2020
- [c17]Chhandak Mukherjee, Marina Deng
, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor
, Sébastien Le Beux, Cédric Marchand
, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu:
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SOC 2020: 76-81 - [c16]Arnaud Poittevin, Chhandak Mukherjee, Ian O'Connor, Cristell Maneux, Guilhem Larrieu, Marina Deng
, Sébastien Le Beux, François Marc, Aurélie Lecestre, Cédric Marchand
, Abhishek Kumar:
3D Logic Cells Design and Results Based on Vertical NWFET Technology Including Tied Compact Model. VLSI-SoC (Selected Papers) 2020: 301-321 - [i1]C. Mukherjee, Marina Deng, François Marc, Cristell Maneux, Arnaud Poittevin, Ian O'Connor, Sébastien Le Beux, Abhishek Kumar, Aurélie Lecestre, Guilhem Larrieu:
3D logic cells design and results based on Vertical NWFET technology including tied compact model. CoRR abs/2005.14039 (2020)
2010 – 2019
- 2019
- [c15]Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer:
Measurement based accurate definition of the SOA edges for SiGe HBTs. BCICTS 2019: 1-4 - [c14]Chhandak Mukherjee, Patrick Mounaix, Cristell Maneux, Michele Natrella, James Seddon
, Chris Graham, Cyril C. Renaud:
First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design. ESSDERC 2019: 150-153 - [c13]Marine Couret
, Gerhard Fischer, Iria Garcia-Lopez, Magali De Matos, François Marc, Cristell Maneux:
Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current. ESSDERC 2019: 154-157 - 2018
- [j14]Christopher H. Bennett
, Jean-Etienne Lorival, François Marc, Theo Cabaret
, Bruno Jousselme
, Vincent Derycke
, Jacques-Olivier Klein
, Cristell Maneux
:
Multiscaled Simulation Methodology for Neuro-Inspired Circuits Demonstrated with an Organic Memristor. IEEE Trans. Multi Scale Comput. Syst. 4(4): 822-832 (2018) - 2017
- [j13]C. Mukherjee
, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux
:
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. Microelectron. Reliab. 73: 146-152 (2017) - [j12]Pascal Chevalier
, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann
, Rickard Lovblom, Cristell Maneux
, Olivier Ostinelli
, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer:
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. Proc. IEEE 105(6): 1035-1050 (2017) - [c12]Chhandak Mukherjee
, Cristell Maneux
, Julien Pezard, Guilhem Larrieu
:
1/f Noise in 3D vertical gate-all-around junction-less silicon nanowire transistors. ESSDERC 2017: 34-37 - [c11]Mathieu Jaoul
, Didier Céli, Cristell Maneux
, Michael Schröter, Andreas Pawlak:
Avalanche compact model featuring SiGe HBTs characteristics up to BVcbo. ESSDERC 2017: 70-73 - 2016
- [c10]Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee
, Cristell Maneux
, Thomas Zimmer, Wei Wei, Henri Happy
:
Physics-based electrical compact model for monolayer Graphene FETs. ESSDERC 2016: 240-243 - [c9]C. Mukherjee
, Thomas Jacquet, Thomas Zimmer, Cristell Maneux
, Anjan Chakravorty, Josef Boeck, Klaus Aufinger:
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. ESSDERC 2016: 260-263 - 2015
- [j11]Thomas Jacquet
, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux
:
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55(9-10): 1433-1437 (2015) - [c8]C. Mukherjee
, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux
, Henri Happy
, Wei Wei:
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. ESSDERC 2015: 176-179 - [c7]Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee
, Cristell Maneux
, Thomas Zimmer:
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors. ESSDERC 2015: 180-183 - [c6]Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux
, Thomas Zimmer:
Graphene FET evaluation for RF and mmWave circuit applications. ISCAS 2015: 2920-2923 - [c5]Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux
, Thomas Zimmer:
Substrate-coupling effect in BiCMOS technology for millimeter wave applications. NEWCAS 2015: 1-4 - 2014
- [c4]C. Mukherjee
, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux
, Henri Happy
, David Mele
:
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. ESSDERC 2014: 305-308 - 2012
- [c3]Bertrand Ardouin, Jean-Yves Dupuy, Jean Godin, Virginie Nodjiadjim, Muriel Riet, François Marc, Gilles Amadou Koné, Sudip Ghosh
, Brice Grandchamp, Cristell Maneux
:
Advancements on reliability-aware analog circuit design. ESSCIRC 2012: 46-52 - [c2]Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux
, Thomas Zimmer:
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. ESSDERC 2012: 189-192 - 2011
- [j10]G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux
, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin:
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51(9-11): 1730-1735 (2011) - [j9]Sudip Ghosh
, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux
, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin:
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51(9-11): 1736-1741 (2011) - [j8]Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux
, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo
, Vincent Derycke
, Christian Gamrat, Jacques-Olivier Klein
:
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 2172-2181 (2011) - 2010
- [j7]G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux
, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin:
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50(9-11): 1548-1553 (2010) - [j6]Sudip Ghosh
, François Marc, Cristell Maneux
, Brice Grandchamp, G. A. Koné, Thomas Zimmer:
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50(9-11): 1554-1558 (2010) - [c1]Sébastien Fregonese, Cristell Maneux
, Thomas Zimmer:
From nanoscale technology scenarios to compact device models for ambipolar devices. ICECS 2010: 57-61
2000 – 2009
- 2007
- [j5]Ian O'Connor
, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement
, Cristell Maneux
, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel
, Trong-Trinh Dang, Régis Leveugle:
CNTFET Modeling and Reconfigurable Logic-Circuit Design. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(11): 2365-2379 (2007) - 2004
- [j4]Nathalie Labat, Nathalie Malbert, Cristell Maneux
, André Touboul:
Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors. Microelectron. Reliab. 44(9-11): 1361-1368 (2004) - [j3]Brice Grandchamp, Cristell Maneux
, Nathalie Labat, André Touboul, Thomas Zimmer:
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44(9-11): 1387-1392 (2004) - 2003
- [j2]J. C. Martin, Cristell Maneux
, Nathalie Labat, André Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin:
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectron. Reliab. 43(9-11): 1725-1730 (2003) - [j1]Mohamed Belhaj
, Cristell Maneux
, Nathalie Labat, André Touboul, Philippe Bove:
High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects. Microelectron. Reliab. 43(9-11): 1731-1736 (2003)
Coauthor Index
aka: Chhandak Mukherjee
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last updated on 2024-06-18 20:33 CEST by the dblp team
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