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P. Mezenge

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2010 – 2019

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2013
[j2]
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  dblp key:
  - journals/mr/BrunelLMBFGBCGMCL13
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  persistent URL:
  - https://dblp.org/rec/journals/mr/BrunelLMBFGBCGMCL13
Laurent Brunel, Benoit Lambert, P. Mezenge, J. Bataille, D. Floriot, Jan Grünenpütt, Hervé Blanck, D. Carisetti, Y. Gourdel, Nathalie Malbert, Arnaud Curutchet, Nathalie Labat:
Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress. Microelectron. Reliab. 53(9-11): 1450-1455 (2013)
2010
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  - journals/mr/LambertJBOMDTFBM10
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  - https://dblp.org/rec/journals/mr/LambertJBOMDTFBM10
Benoit Lambert, G. Jonsson, J. Bataille, C. Ollivier, P. Mezenge, H. Derewonko, H. Thomas, D. Floriot, Hervé Blanck, C. Moreau:
Reliability of high voltage/high power L/S-band Hbt technology. Microelectron. Reliab. 50(9-11): 1543-1547 (2010)

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