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ORCIDGérald Haller
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Journal Articles
- 2012
[j15]R. Llido, Pascal Masson, Arnaud Régnier, Vincent Goubier, Gérald Haller, Vincent Pouget, Dean Lewis:
Effects of 1064 nm laser on MOS capacitor. Microelectron. Reliab. 52(9-10): 1816-1821 (2012)- 2011
- [j14]Roxane Llido, J. Gomez, Vincent Goubier, N. Froidevaux, L. Dufayard, Gérald Haller, Vincent Pouget, Dean Lewis:
Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. Microelectron. Reliab. 51(9-11): 1658-1661 (2011) - 2009
- [j13]Gérald Haller, Aziz Machouat, Dean Lewis, Vincent Pouget:
Net integrity checking by optical localization techniques. Microelectron. Reliab. 49(9-11): 1175-1181 (2009) - 2008
- [j12]Aziz Machouat, Gérald Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, Fabien Essely:
Effect of physical defect on shmoos in CMOS DSM technologies. Microelectron. Reliab. 48(8-9): 1333-1338 (2008) - [j11]Julie Ferrigno, Aziz Machouat, Philippe Perdu, Dean Lewis, Gérald Haller, Vincent Goubier:
Generic simulator for faulty IC. Microelectron. Reliab. 48(8-9): 1592-1596 (2008) - 2007
- [j10]Jérôme Adrian, Nicolas Rodriguez, Fabien Essely, Gérald Haller, Catherine Grosjean, Alain Portavoce
, Christophe Girardeaux:
Investigation of a new method for dopant characterization. Microelectron. Reliab. 47(9-11): 1599-1603 (2007) - 2006
- [j9]Nicolas Rodriguez, Jérôme Adrian, Catherine Grosjean, Gérald Haller, Christophe Girardeaux, Alain Portavoce:
Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectron. Reliab. 46(9-11): 1554-1557 (2006) - 2005
- [j8]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal. Microelectron. Reliab. 45(9-11): 1465-1470 (2005) - 2004
- [j7]D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs:
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44(9-11): 1553-1558 (2004) - [j6]Olivier Crépel, Patrick Poirier, Philippe Descamps, Romain Desplats, Philippe Perdu, Gérald Haller, Abdellatif Firiti:
Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. Microelectron. Reliab. 44(9-11): 1559-1563 (2004) - [j5]Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat:
Understanding the effects of NIR laser stimulation on NMOS transistor. Microelectron. Reliab. 44(9-11): 1675-1680 (2004) - 2003
- [j4]Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis:
Short defect characterization based on TCR parameter extraction. Microelectron. Reliab. 43(9-11): 1563-1568 (2003) - [j3]Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis:
From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectron. Reliab. 43(9-11): 1681-1686 (2003) - 2002
- [j2]Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis:
Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectron. Reliab. 42(9-11): 1729-1734 (2002) - [j1]Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002)
Coauthor Index
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