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2020 – today
- 2024
[i4]Julien Toulemont, Geoffrey Chancel, Frédérick Mailly, Philippe Maurine, Pascal Nouet:
Towards package opening detection at power-up by monitoring thermal dissipation. IACR Cryptol. ePrint Arch. 2024: 1423 (2024)- 2022
- [j19]Ibrahim Shankhour
, Jad Mohdad, Frédérick Mailly, Pascal Nouet:
Fully Electrical Post-Fabrication Trimming of Resistive Sensors. Sensors 22(3): 767 (2022) - 2021
- [c44]Julien Toulemont, Geoffrey Chancel, Jean Marc Gallière, Frédérick Mailly, Pascal Nouet, Philippe Maurine:
On the scaling of EMFI probes. FDTC 2021: 67-73 - [c43]Julien Toulemont, Frédérick Mailly, Philippe Maurine, Pascal Nouet:
Exploring flexible and 3D printing technologies for the design of high spatial resolution EM probes. NEWCAS 2021: 1-4 - 2020
- [c42]Imen Aloui, Néjib Hassen, Pascal Nouet, Kamel Besbes:
Low-voltage Low-power current-mode square-root circuit based on Quasi-floating gate technique. SSD 2020: 761-764 - [c41]Sonia Abdellatif, Brahim Mezghani, Frédérick Mailly, Pascal Nouet:
Optimal Detector Position and Structure for a New 3-axis CMOS Thermal Microaccelerometer. SSD 2020: 1144-1149 - [i3]Julien Toulemont, N. Ouldei-Tebina, Jean Marc Gallière, Pascal Nouet, E. Bourbao, Philippe Maurine:
A Simple Protocol to Compare EMFI Platforms. IACR Cryptol. ePrint Arch. 2020: 1277 (2020)
2010 – 2019
- 2018
- [j18]Emna Chabchoub, Franck Badets, Frédérick Mailly, Pascal Nouet, Mohamed Masmoudi:
A Temperature-Hardened Sensor Interface with a 12-Bit Digital Output Using a Novel Pulse Width Modulation Technique. Sensors 18(4): 1107 (2018) - [c40]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Abdoulaye Gamatié, Pascal Nouet, Frederic Ouattara, Gilles Sassatelli, Kotb Jabeur, Pierre Vanhauwaert, A. Atitoaie, I. Firastrau, Gregory di Pendina, Guillaume Prenat:
Using multifunctional standardized stack as universal spintronic technology for IoT. DATE 2018: 931-936 - [c39]Sonia Abdellatif, Brahim Mezghani, Fares Tounsi, Frédérick Mailly, Pascal Nouet:
Mechanical Solution for Out-of-Plane Sensitivity Enhancement of CMOS MEMS Convective Accelerometers. ICECS 2018: 301-304 - [c38]Sophiane Senni, Frederic Ouattara, Jad Mohdad, Kaan Sevin, Guillaume Patrigeon, Pascal Benoit, Pascal Nouet, Lionel Torres, François Duhem, Gregory di Pendina, Guillaume Prenat:
From Spintronic Devices to Hybrid CMOS/Magnetic System On Chip. VLSI-SoC 2018: 188-191 - 2017
- [c37]Emna Chabchoub, Franck Badets, Mohamed Masmoudi, Pascal Nouet, Frédérick Mailly:
Highly linear voltage-to-time converter based on injection locked relaxation oscillators. SDD 2017: 733-737 - [c36]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Combo of innovative educational approaches to teach industrial test to undergraduate students. EDUCON 2017: 56-64 - [c35]Nicolas Jeanniot, Gaël Pillonnet, Pascal Nouet, Nadine Azémard, Aida Todri-Sanial:
Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic Logic. ICRC 2017: 1-6 - [c34]Emna Chabchoub, Franck Badets, Pascal Nouet, Mohamed Masmoudi, Frédérick Mailly:
A high temperature, 12-bit-time-domain sensor interface based on injection locked oscillator. ISCAS 2017: 1-4 - [c33]Mehdi Baradaran Tahoori, Sarath Mohanachandran Nair, Rajendra Bishnoi, Sophiane Senni, Jad Mohdad, Frédérick Mailly, Lionel Torres, Pascal Benoit, Pascal Nouet, Rui Ma, Martin Kreißig, Frank Ellinger, Kotb Jabeur, Pierre Vanhauwaert, Gregory di Pendina, Guillaume Prenat:
GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack. ISVLSI 2017: 344-349 - [c32]Emna Chabchoub, Franck Badets, Mohamed Masmoudi, Frédérick Mailly, Pascal Nouet:
New time-domain conditioning circuit for resistive sensor: Behavioral modelling for simulation and optimization. MIXDES 2017: 408-411 - 2016
- [c31]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Industrial test project oriented education. EDUCON 2016: 119-124 - [c30]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Per peers learning educational approach to teach industrial test to undergraduate students. EWME 2016: 1-6 - [c29]Beatrice Pradarelli, Pascal Nouet, Laurent Latorre:
Problem-Based Learning Approach to Teach Printed Circuit Boards Test. ICL (1) 2016: 45-57 - [c28]Jie Liang, Liuyang Zhang, Nadine Azémard-Crestani, Pascal Nouet, Aida Todri-Sanial:
Physical description and analysis of doped carbon nanotube interconnects. PATMOS 2016: 250-255 - 2015
- [c27]Ghizlane Mouslih, Aida Todri-Sanial, Pascal Nouet:
On Analysis of On-chip DC-DC Converters for Power Delivery Networks. ISVLSI 2015: 557-560 - 2014
- [j17]Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet:
Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield Improvement of MEMS Convective Accelerometers. J. Electron. Test. 30(1): 87-100 (2014) - [c26]Olivier Bonnaud, Pascal Nouet, Laurent Fesquet, Taieb Mohammed-Brahim:
FINMINA: A French national project to promote innovation in higher education in microelectronics and nanotechnologies. ITHET 2014: 1-8 - 2013
- [j16]Brahim Mezghani, Fares Tounsi, Ahmed Amine Rekik, Frédérick Mailly, Mohamed Masmoudi, Pascal Nouet:
Sensitivity and power modeling of CMOS mems single axis convective accelerometers. Microelectron. J. 44(12): 1092-1098 (2013) - 2012
- [c25]Brahim Mezghani, Fares Tounsi, Mohamed Masmoudi, Ahmed Amine Rekik, Frédérick Mailly, Pascal Nouet:
Efficiency modeling of a CMOS MEMS convective accelerometer. DTIS 2012: 1-5 - [c24]Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet:
An efficient control variates method for yield estimation of analog circuits based on a local model. ICCAD 2012: 415-421 - [c23]Ahmed Amine Rekik, Florence Azaïs, Frédérick Mailly, Pascal Nouet:
Design-for-manufacturability of MEMS convective accelerometers through adaptive electrical calibration strategy. LATW 2012: 1-6 - [c22]Souha Hacine, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Study of a high-resolution and low-power CMOS temperature sensor. NEWCAS 2012: 205-208 - 2011
- [j15]Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet:
A Behavioral Model of MEMS Convective Accelerometers for the Evaluation of Design and Calibration Strategies at System Level. J. Electron. Test. 27(3): 411-423 (2011) - [c21]Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet:
An electrical test method for MEMS convective accelerometers: Development and evaluation. DATE 2011: 806-811 - [c20]Ahmed Amine Rekik, Florence Azaïs, Norbert Dumas, Frédérick Mailly, Pascal Nouet:
Test and calibration of MEMS convective accelerometers with a fully electrical setup. LATW 2011: 1-6 - 2010
- [j14]Norbert Dumas, Florence Azaïs, Frédérick Mailly, Pascal Nouet:
Study of an Electrical Setup for Capacitive MEMS Accelerometers Test and Calibration. J. Electron. Test. 26(1): 111-125 (2010) - [c19]El Mehdi Boujamaa, Boris Alandry, Souha Hacine, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A low power interface circuit for resistive sensors with digital offset compensation. ISCAS 2010: 3092-3095 - [c18]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Experiments on the analysis of phase/frequency-modulated RF signals using digital tester channels. LATW 2010: 1-7
2000 – 2009
- 2009
- [j13]Laurent Latorre, Beatrice Pradarelli, Pascal Nouet:
Integrated Circuits Testing: Remote Access to Test Equipment for Labs and Engineering. Int. J. Online Eng. 5(S1): 43-50 (2009) - [j12]Jean-Robert Manouvrier, Pascal Fonteneau, Charles-Alexandre Legrand, Pascal Nouet, Florence Azaïs:
Characterization of the transient behavior of gated/STI diodes and their associated BJT in the CDM time domain. Microelectron. Reliab. 49(12): 1424-1432 (2009) - [j11]Beatrice Pradarelli, Laurent Latorre, Marie-Lise Flottes, Yves Bertrand, Pascal Nouet:
Remote Labs for Industrial IC Testing. IEEE Trans. Learn. Technol. 2(4): 304-311 (2009) - [c17]Nicolas Pous, Florence Azaïs, Laurent Latorre, Pascal Nouet, Jochen Rivoir:
Exploiting Zero-Crossing for the Analysis of FM Modulated Analog/RF Signals Using Digital ATE. Asian Test Symposium 2009: 261-266 - 2008
- [j10]Hans G. Kerkhoff, Xiao Zhang, Frédérick Mailly, Pascal Nouet, Hongyuan Liu, Andrew Richardson:
A Dependable Micro-Electronic Peptide Synthesizer Using Electrode Data. VLSI Design 2008: 437879:1-437879:9 (2008) - [c16]Norbert Dumas, Florence Azaïs, Frédérick Mailly, Andrew Richardson, Pascal Nouet:
A novel method for test and calibration of capacitive accelerometers with a fully electrical setup. DDECS 2008: 304-309 - [c15]Olivier Leman, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A Closed-Loop Architecture with Digital Output for Convective Accelerometers. ISVLSI 2008: 51-56 - [c14]Boris Alandry, Norbert Dumas, Laurent Latorre, Frédérick Mailly, Pascal Nouet:
A CMOS Multi-sensor System for 3D Orientation Determination. ISVLSI 2008: 57-62 - [i2]Olivier Leman, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Study of First-Order Thermal Sigma-Delta Architecture for Convective Accelerometers. CoRR abs/0805.0920 (2008) - [i1]El Mehdi Boujamaa, Yannick Soulie, Frédérick Mailly, Laurent Latorre, Pascal Nouet:
Rejection of Power Supply Noise in Wheatstone Bridges : Application to Piezoresistive MEMS. CoRR abs/0805.0925 (2008) - 2007
- [c13]Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro:
A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. ETS 2007: 21-28 - [c12]Humberto Campanella, Arantxa Uranga, Pascal Nouet, Pedro De Paco Sanchez, Núria Barniol, Jaume Esteve:
Instantaneous de-embedding of the on-wafer equivalent-circuit parameters of acoustic resonator (FBAR) for integrated circuit applications. SBCCI 2007: 212-217 - 2006
- [j9]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
Electro-thermal Stimuli for MEMS Testing in FSBM Technology. J. Electron. Test. 22(2): 189-198 (2006) - [j8]Christophe Entringer, Philippe Flatresse, Philippe Galy, Florence Azaïs, Pascal Nouet:
Electro-thermal short pulsed simulation for SOI technology. Microelectron. Reliab. 46(9-11): 1482-1485 (2006) - 2005
- [j7]Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell:
A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electron. Test. 21(1): 9-16 (2005) - [j6]Florence Azaïs, B. Caillard, S. Dournelle, P. Salomé, Pascal Nouet:
A new multi-finger SCR-based structure for efficient on-chip ESD protection. Microelectron. Reliab. 45(2): 233-243 (2005) - [c11]Frédérick Mailly, Florence Azaïs, Norbert Dumas, Laurent Latorre, Pascal Nouet:
Towards on-line testing of MEMS using electro-thermal excitation. ETS 2005: 76-81 - [c10]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor. VTS 2005: 213-218 - 2004
- [j5]D. Martin, Romain Desplats, Gérald Haller, Pascal Nouet, Florence Azaïs:
Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. Microelectron. Reliab. 44(9-11): 1553-1558 (2004) - [j4]Laurent Latorre, Vincent Beroulle, Pascal Nouet:
Design of CMOS MEMS based on mechanical resonators using a RF simulation approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(6): 962-967 (2004) - [c9]Norbert Dumas, Florence Azaïs, Laurent Latorre, Pascal Nouet:
Electrically-induced thermal stimuli for MEMS testing. ETS 2004: 60-65 - 2003
- [j3]Uros Kac, Franc Novak, Florence Azaïs, Pascal Nouet, Michel Renovell:
Extending IEEE Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal Test. IEEE Des. Test Comput. 20(2): 32-39 (2003) - 2002
- [j2]M. Dardalhon, Vincent Beroulle, Laurent Latorre, Pascal Nouet, Guy Perez, Jean Marc Nicot, Coumar Oudéa:
Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. Microelectron. Reliab. 42(9-11): 1777-1782 (2002) - [c8]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems. DATE 2002: 1120 - [c7]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Testing Resonant Micro-Electro-Mechanical Sensors using the Oscillation-based Test Methodology. LATW 2002: 99-104 - [c6]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Evaluation of the Oscillation-based Test Methodology for Micro-Electro-Mechanical Systems. VTS 2002: 439-444 - 2001
- [j1]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing. J. Electron. Test. 17(5): 439-450 (2001) - [c5]David Bernard, Christian Landrault, Pascal Nouet:
Interconnect Capacitance Modelling in a VDSM CMOS Technology. VLSI-SOC 2001: 133-144 - [c4]Vincent Beroulle, Laurent Latorre, M. Dardalhon, Coumar Oudéa, Guy Perez, Francis Pressecq, Pascal Nouet:
Impact of Technology Spreading on MEMS design Robustness. VLSI-SOC 2001: 241-251 - [c3]Vincent Beroulle, Yves Bertrand, Laurent Latorre, Pascal Nouet:
Noise optimisation of a piezoresistive CMOS MEMS for magnetic field sensing. VLSI-SOC 2001: 461-472
1990 – 1999
- 1999
- [c2]Laurent Latorre, Yves Bertrand, P. Hazard, Francis Pressecq, Pascal Nouet:
Design, Characterization & Modelling of a CMOS Magnetic Field Sensor. DATE 1999: 239-243 - [c1]A. Toulouse, David Bernard, Christian Landrault, Pascal Nouet:
Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts. DATE 1999: 576-580
Coauthor Index
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last updated on 2024-10-07 01:22 CEST by the dblp team
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