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2020 – today
- 2022
[c4]Chih-Feng Yen, Yu-Ya Huang, Shen-Hao Tsao, Shih-Hao Lin, Chun-Hu Cheng:
Influence of Y2O3 Doped HfO2 High-k Films on Electrical Properties of MOS and MIM Devices. ICKII 2022: 225-229
2010 – 2019
- 2018
- [j6]Chuan-Hsi Liu, Chun-Hu Cheng, Chin-Pao Cheng, Juin J. Liou:
Editorial: IEDMS 2016. Microelectron. Reliab. 83: 207 (2018) - [c3]Chia-Chi Fan, Chun-Yuan Tu, Ming-Huei Lin, Chun-Yen Chang, Chun-Hu Cheng, Yen-Liang Chen, Guan-Lin Liou, Chien Liu, Wu-Ching Chou, Hsiao-Hsuan Hsu:
Interface engineering of ferroelectric negative capacitance FET for hysteresis-free switch and reliability improvement. IRPS 2018: 8-1 - 2017
- [j5]Hsuan-Ling Kao
, Chih-Sheng Yeh, Hsien-Chin Chiu, Cheng-Lin Cho, Chun-Hu Cheng:
A high output power and low phase noise GaN HEMT VCO with array of switchable inductors. Int. J. Circuit Theory Appl. 45(11): 1621-1636 (2017) - [j4]Hua-Chiang Wen, Wu-Ching Chou, Po-Chen Lin, Yeau-Ren Jeng, Chien-Chang Chen, Hung-Ming Chen, Don Son Jiang, Chun-Hu Cheng:
Using nanoindentation to investigate the temperature cycling of Sn-37Pb solders. Microelectron. Reliab. 78: 111-117 (2017) - [j3]Hsien-Chin Chiu, Min-Li Chou, Chun-Hu Cheng, Hsuan-Ling Kao, Cheng-Lin Cho:
Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs. Microelectron. Reliab. 78: 267-271 (2017) - [c2]Chun-Yen Chang, Chia-Chi Fan, Chien Liu, Yu-Chien Chiu, Chun-Hu Cheng:
High speed negative capacitance ferroelectric memory. ASICON 2017: 1-5 - 2015
- [c1]Yu-Chien Chiu, Chun-Yen Chang, Hsiao-Hsuan Hsu, Chun-Hu Cheng, Min-Hung Lee:
Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms. IRPS 2015: 3 - 2014
- [j2]Wun-Kai Wang, Hua-Chiang Wen, Chun-Hu Cheng, Ching-Hua Hung, Wu-Ching Chou, Wei-Hung Yau, Ping-Feng Yang, Yi-Shao Lai:
Nanotribological properties of ALD-processed bilayer TiO2/ZnO films. Microelectron. Reliab. 54(12): 2754-2759 (2014) - 2010
- [j1]Bo-Ching He, Chun-Hu Cheng, Hua-Chiang Wen, Yi-Shao Lai, Ping-Feng Yang, Meng-Hung Lin, Wen-Fa Wu, Chang-Pin Chou:
Evaluation of the nanoindentation behaviors of SiGe epitaxial layer on Si substrate. Microelectron. Reliab. 50(1): 63-69 (2010)
Coauthor Index
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