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Erik H. Volkerink
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2010 – 2019
- 2010
- [j3]Ron Press, Erik H. Volkerink:
The ABCs of ITC. IEEE Des. Test Comput. 27(5): 80 (2010) - [e1]Ron Press, Erik H. Volkerink:
2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. IEEE Computer Society 2010, ISBN 978-1-4244-7206-2 [contents]
2000 – 2009
- 2007
- [j2]Donghwi Lee, Erik H. Volkerink, Intaik Park, Jeff Rearick:
Empirical Validation of Yield Recovery Using Idle-Cycle Insertion. IEEE Des. Test Comput. 24(4): 362-372 (2007) - 2005
- [c10]Erik H. Volkerink, Subhasish Mitra:
Response compaction with any number of unknowns using a new LFSR architecture. DAC 2005: 117-122 - 2004
- [c9]Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra:
Speed Clustering of Integrated Circuits. ITC 2004: 1128-1137 - [c8]Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra:
ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22 - [c7]Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger:
Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52 - 2003
- [j1]Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges:
Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits. J. Electron. Test. 19(2): 125-135 (2003) - [c6]Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink:
ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume. ITC 2003: 1069-1078 - [c5]Erik H. Volkerink, Subhasish Mitra:
Efficient Seed Utilization for Reseeding based Compression. VTS 2003: 232-240 - 2002
- [c4]Erik H. Volkerink, Ajay Khoche, Subhasish Mitra:
Packet-Based Input Test Data Compression Techniques. ITC 2002: 154-163 - [c3]Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra:
Test Vector Compression Using EDA-ATE Synergies. VTS 2002: 97-102 - [c2]Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges:
Test Economics for Multi-site Test with Modern Cost Reduction Techniques. VTS 2002: 411-416 - 2001
- [c1]Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff:
Tackling test trade-offs from design, manufacturing to market using economic modeling. ITC 2001: 1098-1107
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