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"Defect and Fault Modeling Framework for STT-MRAM Testing."

Lizhou Wu et al. (2021)

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DOI: 10.1109/TETC.2019.2960375

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/tetc/WuRTMFMKH21
Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui:
Defect and Fault Modeling Framework for STT-MRAM Testing. IEEE Trans. Emerg. Top. Comput. 9(2): 707-723 (2021)

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