• case-insensitive prefix search: default
  e.g., sig matches "SIGIR" as well as "signal"
• exact word search: append dollar sign ($) to word
  e.g., graph$ matches "graph", but not "graphics"
• boolean and: separate words by space
  e.g., codd model
• boolean or: connect words by pipe symbol (|)
  e.g., graph|network

Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.

found 38 matches

• 2020
• 
  Manu Baby, Bernd Büttner, Piet Engelke, Ulrike Pfannkuchen, Reinhard Meier, Jonathan Gaudet, Jean-François Côté, Givargis Danialy, Martin Keim, Lori Schramm:
  IJTAG Through a Two-Pin Chip Interface. ITC 2020: 1-5
• 2017
• 
  Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans G. Kerkhoff, Rene Krenz-Baath, Piet Engelke:
  BASTION: Board and SoC test instrumentation for ageing and no failure found. DATE 2017: 115-120
• 2014
• 
  Piet Engelke:
  Struktureller Test im System. Aspekte der Technischen Informatik 2014: 5-10
• 
  Felix Reimann, Michael Glaß, Jürgen Teich, Alejandro Cook, Laura Rodríguez Gómez, Dominik Ull, Hans-Joachim Wunderlich, Piet Engelke, Ulrich Abelein:
  Advanced Diagnosis: SBST and BIST Integration in Automotive E/E Architectures. DAC 2014: 96:1-96:9
• 
  Ulrich Abelein, Alejandro Cook, Piet Engelke, Michael Glaß, Felix Reimann, Laura Rodríguez Gómez, Thomas Russ, Jürgen Teich, Dominik Ull, Hans-Joachim Wunderlich:
  Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures. DATE 2014: 1-6
• 2013
• 
  Tobias Koal, Markus Ulbricht, Piet Engelke, Heinrich Theodor Vierhaus:
  On the feasibility of combining on-line-test and self repair for logic circuits. DDECS 2013: 187-192
• 2012
• 
  Christian Gleichner, Heinrich Theodor Vierhaus, Piet Engelke:
  Scan Based Tests via Standard Interfaces. DSD 2012: 844-851
• 
  Piet Engelke, Hermann Obermeir:
  Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. ETS 2012: 1
• 2010
• 
  Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
  Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Int. J. Parallel Program. 38(3-4): 185-202 (2010)
• 2009
• 
  Piet Engelke:
  Resistive bridging faults - defect-oriented modeling and efficient testing (Resistive bridging faults - defektorientierte Modellierung und effizienter Test). University of Freiburg, Germany, 2009
• 
  Piet Engelke, Bernd Becker, Michel Renovell, Jürgen Schlöffel, Bettina Braitling, Ilia Polian:
  SUPERB: Simulator utilizing parallel evaluation of resistive bridges. ACM Trans. Design Autom. Electr. Syst. 14(4): 56:1-56:21 (2009)
• 
  Alejandro Czutro, Ilia Polian, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
  Dynamic Compaction in SAT-Based ATPG. Asian Test Symposium 2009: 187-190
• 
  Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
  TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis. VLSI Design 2009: 227-232
• 
  Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker:
  An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26
• 2008
• 
  Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker:
  On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 327-338 (2008)
• 
  Piet Engelke, Ilia Polian, Jürgen Schlöffel, Bernd Becker:
  Resistive Bridging Fault Simulation of Industrial Circuits. DATE 2008: 628-633
• 
  Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen:
  Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266
• 
  Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker:
  A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS 2008: 113-118
• 
  Stefan Hillebrecht, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng:
  Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model. ITC 2008: 1-10
• 
  Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng:
  Automatic Test Pattern Generation for Interconnect Open Defects. VTS 2008: 181-186
• 2007
• 
  Piet Engelke, Bettina Braitling, Ilia Polian, Michel Renovell, Bernd Becker:
  SUPERB: Simulator Utilizing Parallel Evaluation of Resistive Bridges. ATS 2007: 433-438
• 
  Stefan Spinner, Jie Jiang, Ilia Polian, Piet Engelke, Bernd Becker:
  Simulating Open-Via Defects. ATS 2007: 265-270
• 2006
• 
  Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker:
  Automatic Test Pattern Generation for Resistive Bridging Faults. J. Electron. Test. 22(1): 61-69 (2006)
• 
  Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker:
  Simulating Resistive-Bridging and Stuck-At Faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(10): 2181-2192 (2006)
• 
  Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke:
  X-masking during logic BIST and its impact on defect coverage. IEEE Trans. Very Large Scale Integr. Syst. 14(2): 193-202 (2006)
• 
  Piet Engelke, Ilia Polian, Hans Manhaeve, Michel Renovell, Bernd Becker:
  Delta-IDDQ Testing of Resistive Short Defects. ATS 2006: 63-68
• 
  Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker:
  A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency. ATS 2006: 273-278
• 2005
• 
  Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker:
  Modeling Feedback Bridging Faults with Non-Zero Resistance. J. Electron. Test. 21(1): 57-69 (2005)
• 
  Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker:
  On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Asian Test Symposium 2005: 266-271
• 
  Gang Chen, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Piet Engelke, Bernd Becker:
  A unified fault model and test generation procedure for interconnect opens and bridges. ETS 2005: 22-27

skipping 8 more matches