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Journal Articles
- 2018
[j21]Philipp Hillger
, Ritesh Jain, Janusz Grzyb, Wolfgang Forster, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer:
A 128-Pixel System-on-a-Chip for Real-Time Super-Resolution Terahertz Near-Field Imaging. IEEE J. Solid State Circuits 53(12): 3599-3612 (2018)- 2017
- [j20]C. Mukherjee, Thomas Jacquet, Anjan Chakravorty, Thomas Zimmer, Josef Boeck, Klaus Aufinger, Cristell Maneux:
Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit. Microelectron. Reliab. 73: 146-152 (2017) - [j19]Pascal Chevalier, Michael Schröter, Colombo R. Bolognesi, Vincenzo d'Alessandro, Maria Alexandrova, Josef Böck, Ralf Flickiger, Sébastien Fregonese, Bernd Heinemann, Christoph Jungemann, Rickard Lovblom, Cristell Maneux, Olivier Ostinelli, Andreas Pawlak, Niccolò Rinaldi, Holger Rücker, Gerald Wedel, Thomas Zimmer:
Si/SiGe: C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications. Proc. IEEE 105(6): 1035-1050 (2017) - 2015
- [j18]Thomas Zimmer:
From the eScience Project Chair. Int. J. Interact. Mob. Technol. 9(2): 4 (2015) - [j17]Thomas Zimmer, Michel Billaud, M. Pic, Didier Geoffroy:
Remote Lab Experiments in Electronics for Use and Reuse. Int. J. Interact. Mob. Technol. 9(2): 13-16 (2015) - [j16]Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux:
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit. Microelectron. Reliab. 55(9-10): 1433-1437 (2015) - 2014
- [j15]Thomas Zimmer:
TEMPUS Project eSience. Int. J. Online Eng. 10(5): 4 (2014) - [j14]Thrasyvoulos Tsiatsos, Stella Douka, Apostolos Mavridis, Stergios Tegos, Ahmed Naddami, Thomas Zimmer, Didier Geoffroy:
Evaluation Plan and Preliminary Evaluation of a Network of Remote Labs in the Maghrebian Countries. Int. J. Online Eng. 10(5): 15-20 (2014) - 2012
- [j13]Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc:
Impact of Power Consumption and Temperature on Processor Lifetime Reliability. J. Low Power Electron. 8(1): 83-94 (2012) - 2011
- [j12]G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean Godin:
Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. Microelectron. Reliab. 51(9-11): 1730-1735 (2011) - [j11]Sudip Ghosh, Brice Grandchamp, G. A. Koné, François Marc, Cristell Maneux, Thomas Zimmer, Virginie Nodjiadjim, Muriel Riet, Jean-Yves Dupuy, Jean Godin:
Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design. Microelectron. Reliab. 51(9-11): 1736-1741 (2011) - [j10]Si-Yu Liao, Jean-Marie Retrouvey, Guillaume Agnus, Weisheng Zhao, Cristell Maneux, Sébastien Fregonese, Thomas Zimmer, Djaafar Chabi, Arianna Filoramo, Vincent Derycke, Christian Gamrat, Jacques-Olivier Klein:
Design and Modeling of a Neuro-Inspired Learning Circuit Using Nanotube-Based Memory Devices. IEEE Trans. Circuits Syst. I Regul. Pap. 58-I(9): 2172-2181 (2011) - 2010
- [j9]G. A. Koné, Brice Grandchamp, C. Hainaut, François Marc, Cristell Maneux, Nathalie Labat, Thomas Zimmer, Virginie Nodjiadjim, Jean Godin:
Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. Microelectron. Reliab. 50(9-11): 1548-1553 (2010) - [j8]Sudip Ghosh, François Marc, Cristell Maneux, Brice Grandchamp, G. A. Koné, Thomas Zimmer:
Thermal aging model of InP/InGaAs/InP DHBT. Microelectron. Reliab. 50(9-11): 1554-1558 (2010) - 2009
- [j7]Noëlle Lewis, Michel Billaud, Didier Geoffroy, Philippe Cazenave, Thomas Zimmer:
A Distance Measurement Platform Dedicated to Electrical Engineering. IEEE Trans. Learn. Technol. 2(4): 312-319 (2009) - 2007
- [j6]Thomas Zimmer, Michel Billaud, Didier Geoffroy:
Integration of remote lab exercises into standard course packages. Int. J. Online Eng. 3(3) (2007) - [j5]Ian O'Connor, Junchen Liu, Frédéric Gaffiot, Fabien Prégaldiny, Christophe Lallement, Cristell Maneux, Johnny Goguet, Sébastien Fregonese, Thomas Zimmer, Lorena Anghel, Trong-Trinh Dang, Régis Leveugle:
CNTFET Modeling and Reconfigurable Logic-Circuit Design. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(11): 2365-2379 (2007) - 2006
- [j4]Didier Geoffroy, Thomas Zimmer, Michel Billaud:
A remote laboratory for electrical engineering education. Int. J. Online Eng. 2(3) (2006) - 2005
- [j3]Yvan Maidon, Thomas Zimmer, André Ivanov:
An Analog Circuit Fault Characterization Methodology. J. Electron. Test. 21(2): 127-134 (2005) - 2004
- [j2]Hassène Mnif, Thomas Zimmer, Jean Luc Battaglia, Sébastien Fregonese:
Representation of the SiGe HBT's thermal impedance by linear and recursive networks. Microelectron. Reliab. 44(6): 945-950 (2004) - [j1]Brice Grandchamp, Cristell Maneux, Nathalie Labat, André Touboul, Thomas Zimmer:
On-wafer low frequency noise measurements of SiGe HBTs: Impact of technological improvements on 1/f noise. Microelectron. Reliab. 44(9-11): 1387-1392 (2004)
Conference and Workshop Papers
- 2023
- [c21]Thomas Zimmer, Sébastien Fregonese, Anjan Chakravorty:
Electro-Thermal Investigation of SiGe HBTs: A Review. BCICTS 2023: 44-49 - 2021
- [c20]Sébastien Fregonese, Chhandak Mukherjee, Holger Rücker, Pascal Chevalier, Gerhard Fischer, Didier Céli, Marina Deng, Marine Couret, François Marc, Cristell Maneux, Thomas Zimmer:
Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance. BCICTS 2021: 1-7 - 2019
- [c19]Mathieu Jaoul, Didier Céli, Cristell Maneux, Thomas Zimmer:
Measurement based accurate definition of the SOA edges for SiGe HBTs. BCICTS 2019: 1-4 - [c18]Soumya Ranjan Panda, Sébastien Fregonese, Anjan Chakravorty, Thomas Zimmer:
TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range. BCICTS 2019: 1-4 - [c17]Bishwadeep Saha, Sébastien Frégonese, Soumya Ranjan Panda, Anjan Chakravorty, Didier Céli, Thomas Zimmer:
Collector-substrate modeling of SiGe HBTs up to THz range. BCICTS 2019: 1-4 - 2018
- [c16]D. Fadi, Wei Wei, Emiliano Pallecchi, M. Anderson, J. Stake, Marina Deng, Sébastien Fregonese, Thomas Zimmer, Henri Happy:
2D RF Electronics: from devices to circuits - challenges and applications. DRC 2018: 1-2 - [c15]Philipp Hillger, Ritesh Jain, Janusz Grzyb, Laven Mavarani, Bernd Heinemann, Gaetan MacGrogan, Patrick Mounaix, Thomas Zimmer, Ullrich R. Pfeiffer:
A 128-pixel 0.56THz sensing array for real-time near-field imaging in 0.13μm SiGe BiCMOS. ISSCC 2018: 418-420 - 2017
- [c14]J. Bazzi, H. Kassem, Arnaud Curutchet, Franck Pourchon, N. Derrier, Didier Céli, Thomas Zimmer:
A two-step de-embedding method valid up to 110 GHz. ICM 2017: 1-4 - 2016
- [c13]Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer, Wei Wei, Henri Happy:
Physics-based electrical compact model for monolayer Graphene FETs. ESSDERC 2016: 240-243 - [c12]C. Mukherjee, Thomas Jacquet, Thomas Zimmer, Cristell Maneux, Anjan Chakravorty, Josef Boeck, Klaus Aufinger:
Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations. ESSDERC 2016: 260-263 - 2015
- [c11]C. Mukherjee, Jorgue Daniel Aguirre Morales, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, Wei Wei:
Characterization and modeling of low-frequency noise in CVD-grown graphene FETs. ESSDERC 2015: 176-179 - [c10]Jorgue Daniel Aguirre Morales, Sébastien Fregonese, C. Mukherjee, Cristell Maneux, Thomas Zimmer:
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors. ESSDERC 2015: 180-183 - [c9]Thomas Zimmer, Michel Billaud, Emmanouil D. Fylladitakis, Petros J. Axaopoulos:
HeliosLab: A remote photovoltaic laboratory. exp.at 2015: 52-55 - [c8]Sébastien Fregonese, Jorgue Daniel Aguirre Morales, Magali De Matos, Cristell Maneux, Thomas Zimmer:
Graphene FET evaluation for RF and mmWave circuit applications. ISCAS 2015: 2920-2923 - [c7]Sébastien Fregonese, Rosario D'Esposito, Magali De Matos, Andreas Kohler, Cristell Maneux, Thomas Zimmer:
Substrate-coupling effect in BiCMOS technology for millimeter wave applications. NEWCAS 2015: 1-4 - 2014
- [c6]C. Mukherjee, Sébastien Fregonese, Thomas Zimmer, Cristell Maneux, Henri Happy, David Mele:
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation. ESSDERC 2014: 305-308 - 2012
- [c5]Mario Weis, Sébastien Fregonese, Marco Santorelli, Amit Kumar Sahoo, Cristell Maneux, Thomas Zimmer:
Pulsed I(V) - pulsed RF measurement system for microwave device characterization with 80ns/45GHz. ESSDERC 2012: 189-192 - 2010
- [c4]Sébastien Fregonese, Cristell Maneux, Thomas Zimmer:
From nanoscale technology scenarios to compact device models for ambipolar devices. ICECS 2010: 57-61 - [c3]Tushar Gupta, Clement Bertolini, Olivier Héron, Nicolas Ventroux, Thomas Zimmer, François Marc:
High Level Power and Energy Exploration Using ArchC. SBAC-PAD 2010: 25-32 - 1999
- [c2]Thomas Zimmer, Noëlle Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat:
Hierarchical Analogue Design and Behavioural Modelling. MSE 1999: 59-60 - 1997
- [c1]Thomas Zimmer, Patrice Kadionik, Yves Danto:
A World-Wide-Web based instrumentation pool real testing in a virtual world. MSE 1997: 114-115
Coauthor Index
aka: Sébastien Frégonese
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