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ORCIDSobeeh Almukhaizim
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Journal Articles
- 2013
[j14]Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu
:
Reconfigurable Concurrent Error Detection Adaptive to Dynamicity of Power Constraints. J. Electron. Test. 29(1): 73-86 (2013)- [j13]Samah Mohamed Saeed, Ozgur Sinanoglu, Sobeeh Almukhaizim:
Predictive Techniques for Projecting Test Data Volume Compression. IEEE Trans. Very Large Scale Integr. Syst. 21(9): 1762-1766 (2013) - 2011
- [j12]Eman AlQuraishi, May Al-Roomi, Sobeeh Almukhaizim:
Analysis of the soft error susceptibility and failure rate in logic circuits. Int. Arab J. Inf. Technol. 8(4): 388-396 (2011) - [j11]Sobeeh Almukhaizim, Ozgur Sinanoglu:
Novel hazard-free majority voter for n-modular redundancy-based fault tolerance in asynchronous circuits. IET Comput. Digit. Tech. 5(4): 306-315 (2011) - [j10]Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu:
Test Power Reduction via Deterministic Alignment of Stimulus and Response Bits. J. Low Power Electron. 7(4): 573-584 (2011) - [j9]Ozgur Sinanoglu, Sobeeh Almukhaizim:
Unified 2-D X-Alignment for Improving the Observability of Response Compactors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(11): 1744-1757 (2011) - 2010
- [j8]Sobeeh Almukhaizim, Shouq Alsubaihi, Ozgur Sinanoglu:
On the Application of Dynamic Scan Chain Partitioning for Reducing Peak Shift Power. J. Electron. Test. 26(4): 465-481 (2010) - 2009
- [j7]Sobeeh Almukhaizim, Ozgur Sinanoglu:
Dynamic Scan Chain Partitioning for Reducing Peak Shift Power During Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(2): 298-302 (2009) - [j6]Sobeeh Almukhaizim, Feng Shi, Eric Love, Yiorgos Makris:
Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits. IEEE Trans. Very Large Scale Integr. Syst. 17(7): 869-882 (2009) - [j5]Ozgur Sinanoglu, Sobeeh Almukhaizim:
X-Align: Improving the Scan Cell Observability of Response Compactors. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1392-1404 (2009) - 2008
- [j4]Sobeeh Almukhaizim, Yiorgos Makris:
Soft Error Mitigation Through Selective Addition of Functionally Redundant Wires. IEEE Trans. Reliab. 57(1): 23-31 (2008) - 2007
- [j3]Sobeeh Almukhaizim, Yiorgos Makris:
Concurrent Error Detection Methods for Asynchronous Burst-Mode Machines. IEEE Trans. Computers 56(6): 785-798 (2007) - 2006
- [j2]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Entropy-driven parity-tree selection for low-overhead concurrent error detection in finite state machines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(8): 1547-1554 (2006) - 2005
- [j1]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Compaction-based concurrent error detection for digital circuits. Microelectron. J. 36(9): 856-862 (2005)
Conference and Workshop Papers
- 2011
- [c26]Sobeeh Almukhaizim, Eman AlQuraishi, Ozgur Sinanoglu:
Test power reduction via deterministic alignment of stimulus and response bits. LATW 2011: 1-6 - [c25]Sobeeh Almukhaizim, Ozgur Sinanoglu:
Error-resilient design of branch predictors for effective yield improvement. LATW 2011: 1-6 - 2010
- [c24]Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu:
Reconfigurable Concurrent Error Detection adaptive to dynamicity of power constraints. ETS 2010: 248 - [c23]Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah:
Test power reduction in compression-based reconfigurable scan architectures. ETS 2010: 249 - [c22]Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Eman AlQuraishi:
Cost-free low-power test in compression-based reconfigurable scan designs. IDT 2010: 78-82 - [c21]Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu:
Reconfigurable low-power Concurrent Error Detection in logic circuits. IDT 2010: 91-96 - [c20]Junxia Ma, Mohammad Tehranipoor, Ozgur Sinanoglu, Sobeeh Almukhaizim:
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG. IDT 2010: 122-127 - [c19]Sobeeh Almukhaizim, Sara Bunian, Ozgur Sinanoglu:
Reconfigurable low-power Concurrent Error Detection in logic circuits. IOLTS 2010: 206-207 - [c18]Ozgur Sinanoglu, Sobeeh Almukhaizim:
Predictive analysis for projecting test compression levels. ITC 2010: 275-284 - [c17]Sobeeh Almukhaizim, Mohammad Gh. Mohammad, Mohammad Khajah:
Low-power test in compression-based reconfigurable scan architectures. SBCCI 2010: 55-60 - 2009
- [c16]Ozgur Sinanoglu, Sobeeh Almukhaizim:
X-alignment techniques for improving the observability of response compactors. ITC 2009: 1-10 - 2008
- [c15]Sobeeh Almukhaizim, Feng Shi, Yiorgos Makris:
Coping with Soft Errors in Asynchronous Burst-Mode Machines. ASYNC 2008: 151-160 - [c14]Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris:
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD. IOLTS 2008: 123-128 - [c13]Sobeeh Almukhaizim, Ozgur Sinanoglu:
Peak Power Reduction Through Dynamic Partitioning of Scan Chains. ITC 2008: 1-10 - 2006
- [c12]Sobeeh Almukhaizim, Yiorgos Makris:
Berger code-based concurrent error detection in asynchronous burst-mode machines. DATE 2006: 71-72 - [c11]Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, Andreas G. Veneris:
Seamless Integration of SER in Rewiring-Based Design Space Exploration. ITC 2006: 1-9 - 2005
- [c10]Sobeeh Almukhaizim, Yiorgos Makris:
Concurrent Error Detection in Asynchronous Burst-Mode Controllers. DATE 2005: 1272-1277 - 2004
- [c9]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
On Concurrent Error Detection with Bounded Latency in FSMs. DATE 2004: 596-603 - [c8]Feng Shi, Sobeeh Almukhaizim, Pey-Chang Lin, Yiorgos Makris:
Compiler-Based Frame Formation for Static Optimization. ICCD 2004: 466-471 - [c7]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Concurrent Error Detection for Combinational and Sequential Logic via Output Compaction. ISQED 2004: 459-464 - [c6]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Cost-Driven Selection of Parity Trees. VTS 2004: 319-324 - 2003
- [c5]Sobeeh Almukhaizim, Yiorgos Makris:
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code. DFT 2003: 563-570 - [c4]Sobeeh Almukhaizim, Thomas Verdel, Yiorgos Makris:
Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case. ICCD 2003: 194-197 - [c3]Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
On Compaction-Based Concurrent Error Detection. IOLTS 2003: 157 - 2001
- [c2]Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu:
Faults in Processor Control Subsystems: Testing Correctness and Performance Faults in the Data Prefetching Unit. Asian Test Symposium 2001: 319-324 - [c1]Sobeeh Almukhaizim, Peter Petrov, Alex Orailoglu:
Low-cost, software-based self-test methodologies for performance faults in processor control subsystems. CICC 2001: 263-266
Coauthor Index
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