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Journal Articles
- 2009
[j26]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
Variable Input Delay CMOS Logic for Low Power Design. IEEE Trans. Very Large Scale Integr. Syst. 17(10): 1534-1545 (2009)- 2007
- [j25]Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal:
Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. IEEE Trans. Very Large Scale Integr. Syst. 15(11): 1245-1255 (2007) - 2006
- [j24]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
Transistor Sizing of Logic Gates to Maximize Input Delay Variability. J. Low Power Electron. 2(1): 121-128 (2006) - 2004
- [j23]Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell:
A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults. J. Comput. Sci. Technol. 19(6): 955-964 (2004) - 2000
- [j22]Marwan A. Gharaybeh, Vishwani D. Agrawal, Michael L. Bushnell, Carlos G. Parodi:
False-Path Removal Using Delay Fault Simulation. J. Electron. Test. 16(5): 463-476 (2000) - [j21]Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Path delay fault simulation of sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(2): 223-228 (2000) - [j20]Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Improving path delay testability of sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 736-741 (2000) - 1999
- [j19]Rajesh Ramadoss, Michael L. Bushnell:
Test Generation for Mixed-Signal Devices Using Signal Flow Graphs. J. Electron. Test. 14(3): 189-205 (1999) - [j18]Madhu K. Iyer, Michael L. Bushnell:
Effect of Noise on Analog Circuit Testing. J. Electron. Test. 15(1-2): 11-22 (1999) - 1998
- [j17]Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas:
Statistical Delay Fault Coverage Estimation for Synchronous Sequential Circuits. J. Electron. Test. 12(3): 239-254 (1998) - [j16]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
The path-status graph with application to delay fault simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(4): 324-332 (1998) - [j15]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
A parallel-vector concurrent-fault simulator and generation of single-input-change tests for path-delay faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 17(9): 873-876 (1998) - 1997
- [j14]Michael L. Bushnell, John Giraldi:
A Functional Decomposition Method for Redundancy Identification and Test Generation. J. Electron. Test. 10(3): 175-195 (1997) - [j13]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
Classification and Test Generation for Path-Delay Faults Using Single Struck-at Fault Tests. J. Electron. Test. 11(1): 55-67 (1997) - [j12]Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell, Janak H. Patel:
Improving a nonenumerative method to estimate path delay fault coverage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(7): 759-762 (1997) - [j11]Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
On variable clock methods for path delay testing of sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(11): 1237-1249 (1997) - 1996
- [j10]Xinghao Chen, Michael L. Bushnell:
Sequential circuit test generation using dynamic justification equivalence. J. Electron. Test. 8(1): 9-33 (1996) - 1995
- [j9]Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell:
Fault coverage estimation by test vector sampling. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 590-596 (1995) - 1994
- [j8]Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell:
Energy minimization and design for testability. J. Electron. Test. 5(1): 57-66 (1994) - 1992
- [j7]Srimat T. Chakradhar, Michael L. Bushnell:
A solvable class of quadratic 0-1 programming. Discret. Appl. Math. 36(3): 233-251 (1992) - 1990
- [j6]Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell, Thomas K. Truong:
Neural Net and Boolean Satisfiability Models of Logic Circuits. IEEE Des. Test Comput. 7(5): 54-57 (1990) - [j5]Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal:
Toward massively parallel automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(9): 981-994 (1990) - 1989
- [j4]Michael L. Bushnell, Stephen W. Director:
Automated design tool execution in the Ulysses design environment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(3): 279-287 (1989) - 1987
- [j3]Michael L. Bushnell, Stephen W. Director:
ULYSSES - a knowledge-based VLSI design environment. Artif. Intell. Eng. 2(1): 33-41 (1987) - 1986
- [j2]Michael L. Bushnell, Pierre Haren:
Guest editorial. Artif. Intell. Eng. 1(2): 67-69 (1986) - 1984
- [j1]David P. LaPotin, Sani R. Nassif, Jayanth V. Rajan, Michael L. Bushnell, John A. Nestor:
DIF: A framework for VLSI multi-level representation. Integr. 2(3): 227-241 (1984)
Conference and Workshop Papers
- 2008
- [c70]Hari Vijay Venkatanarayanan, Michael L. Bushnell:
A Jitter Reduction Circuit Using Autocorrelation for Phase-Locked Loops and Serializer-Deserializer (SERDES) Circuits. VLSI Design 2008: 581-588 - [c69]Rajamani Sethuram, Michael L. Bushnell, Vishwani D. Agrawal:
Fault Nodes in Implication Graph for Equivalence/Dominance Collapsing, and Identifying Untestable and Independent Faults. VTS 2008: 329-335 - 2007
- [c68]Baozhen Yu, Michael L. Bushnell:
Power Grid Analysis of Dynamic Power Cutoff Technology. ISCAS 2007: 1393-1396 - [c67]Omar I. Khan, Michael L. Bushnell, Suresh Kumar Devanathan, Vishwani D. Agrawal:
SPARTAN: a spectral and information theoretic approach to partial-scan. ITC 2007: 1-10 - [c66]Rohit Pandey, Michael L. Bushnell:
Architecture for Variable-Length Combined FFT, DCT, and MWT Transform Hardware for a Multi-ModeWireless System. VLSI Design 2007: 121-126 - [c65]Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell:
Zero Cost Test Point Insertion Technique for Structured ASICs. VLSI Design 2007: 357-363 - [c64]Suresh Kumar Devanathan, Michael L. Bushnell:
Test Pattern Generation Using Modulation by Haar Wavelets and Correlation for Sequential BIST. VLSI Design 2007: 485-491 - [c63]Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie
:
Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. VLSI Design 2007: 657-664 - [c62]Rajamani Sethuram, Omar I. Khan, Hari Vijay Venkatanarayanan, Michael L. Bushnell:
A Neural Net Branch Predictor to Reduce Power. VLSI Design 2007: 679-684 - [c61]Jeffrey Ayres, Michael L. Bushnell:
Analog Circuit Testing Using Auto Regressive Moving Average Models. VLSI Design 2007: 775-780 - 2006
- [c60]Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell:
Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. ATS 2006: 339-348 - [c59]Baozhen Yu, Michael L. Bushnell:
A novel dynamic power cutoff technique (DPCT) for active leakage reduction in deep submicron CMOS circuits. ISLPED 2006: 214-219 - [c58]Hari Vijay Venkatanarayanan, Michael L. Bushnell:
An Area Efficient Mixed-Signal Test Architecture for Systems-on-a-Chip. VLSI Design 2006: 161-168 - [c57]Suresh Kumar Devanathan, Michael L. Bushnell:
Sequential Spectral ATPG Using the Wavelet Transform and Compaction. VLSI Design 2006: 407-412 - [c56]Shweta Chary, Michael L. Bushnell:
Automatic Path-Delay Fault Test Generation for Combined Resistive Vias, Resistive Bridges, and Capacitive Crosstalk Delay Faults. VLSI Design 2006: 413-418 - [c55]Omar I. Khan, Michael L. Bushnell:
Aliasing Analysis of Spectral Statistical Response Compaction Techniques. VLSI Design 2006: 801-806 - [c54]Shweta Chary, Michael L. Bushnell:
Analog Macromodeling for Combined Resistive Vias, Resistive Bridges, and Capacitive Crosstalk Delay Faults. VLSI Design 2006: 818-823 - 2005
- [c53]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
Design of Variable Input Delay Gates for Low Dynamic Power Circuits. PATMOS 2005: 436-445 - [c52]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
Variable Input Delay CMOS Logic for Low Power Design. VLSI Design 2005: 598-605 - [c51]Kunal K. Dave, Vishwani D. Agrawal, Michael L. Bushnell:
Using Contrapositive Law in an Implication Graph to Identify Logic Redundancies. VLSI Design 2005: 723-729 - 2004
- [c50]Omar I. Khan, Michael L. Bushnell:
Spectral Analysis for Statistical Response Compaction During Built-In Self-Testing. ITC 2004: 67-76 - [c49]Junwu Zhang, Michael L. Bushnell, Vishwani D. Agrawal:
On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits. ITC 2004: 617-626 - [c48]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
A Tuturial on the Emerging Nanotechnology Devices. VLSI Design 2004: 343-360 - [c47]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
CMOS Circuit Design for Minimum Dynamic Power and Highest Speed. VLSI Design 2004: 1035-1040 - 2003
- [c46]Vishal J. Mehta, Kunal K. Dave, Vishwani D. Agrawal, Michael L. Bushnell:
A Fault-Independent Transitive Closure Algorithm for Redundancy Identification. VLSI Design 2003: 149-154 - [c45]Lan Rao, Michael L. Bushnell, Vishwani D. Agrawal:
New Graphical IDDQ Signatures Reduce Defect Level and Yield Loss. VLSI Design 2003: 353-360 - [c44]Tezaswi Raja, Vishwani D. Agrawal, Michael L. Bushnell:
Minimum Dynamic Power CMOS Circuit Design by a Reduced Constraint Set Linear Program. VLSI Design 2003: 527-532 - 2002
- [c43]Vivek Gaur, Vishwani D. Agrawal, Michael L. Bushnell:
A New Transitive Closure Algorithm with Application to Redundancy Identification. DELTA 2002: 496-500 - [c42]Aditya D. Sathe, Michael L. Bushnell, Vishwani D. Agrawal:
Analog Macromodeling of Capacitive Coupling Faults in Digital Circuit Interconnects. ITC 2002: 375-383 - [c41]Vishwani D. Agrawal, Michael L. Bushnell:
Electronic Testing for SOC Designers (Tutorial Abstract). ASP-DAC/VLSI Design 2002: 20 - 2001
- [c40]Sanjay Mohan, Michael L. Bushnell:
A Code Transition Delay Model for ADC Test. VLSI Design 2001: 274-282 - 1999
- [c39]Michael L. Bushnell:
Increasing Test Coverage in a VLSI Design Course. ITC 1999: 1133 - [c38]Vishwani D. Agrawal, Michael L. Bushnell, Ganapathy Parthasarathy, Rajesh Ramadoss:
Digital Circuit Design for Minimum Transient Energy and a Linear Programming Method. VLSI Design 1999: 434-439 - [c37]Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell:
A Complete Characterization of Path Delay Faults through Stuck-at Faults. VLSI Design 1999: 492-497 - 1998
- [c36]Marwan A. Gharaybeh, Vishwani D. Agrawal, Michael L. Bushnell:
False-Path Removal Using Delay Fault Simulation. Asian Test Symposium 1998: 82-87 - [c35]Carlos G. Parodi, Vishwani D. Agrawal, Michael L. Bushnell, Shianling Wu:
A non-enumerative path delay fault simulator for sequential circuits. ITC 1998: 934-943 - [c34]Subhashis Majumder, Michael L. Bushnell, Vishwani D. Agrawal:
Path Delay Testing: Variable-Clock Versus Rated-Clock. VLSI Design 1998: 470-475 - [c33]Madhu K. Iyer, Michael L. Bushnell:
Effect of Noise on Analog Circuit Testing. VTS 1998: 138-144 - [c32]Subhashis Majumder, Vishwani D. Agrawal, Michael L. Bushnell:
On Delay-Untestable Paths and Stuck-Fault Redundancy. VTS 1998: 194-199 - [c31]Ganapathy Parthasarathy, Michael L. Bushnell:
Towards Simultaneous Delay-Fault Built-In Self-Test and Partial-Scan Insertion. VTS 1998: 210-217 - 1997
- [c30]Mandyam-Komar Srinivas, Michael L. Bushnell, Vishwani D. Agrawal:
Flags and Algebra for Sequential Circuit VNR Path Delay Fault Test Generation. VLSI Design 1997: 88-94 - 1996
- [c29]Vishwani D. Agrawal, Michael L. Bushnell, Qing Lin:
Redundancy Identification Using Transitive Closure. Asian Test Symposium 1996: 4-9 - [c28]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
An Exact Non-Enumerative Fault Simulator for Path-Delay Faults. ITC 1996: 276-285 - [c27]Rajesh Ramadoss, Michael L. Bushnell:
Test generation for mixed-signal devices using signal flow graphs. VLSI Design 1996: 242-248 - [c26]Lakshminarayana Pappu, Michael L. Bushnell, Vishwani D. Agrawal, Mandyam-Komar Srinivas:
Statistical path delay fault coverage estimation for synchronous sequential circuits. VLSI Design 1996: 290-295 - [c25]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
Parallel concurrent path-delay fault simulation using single-input change patterns. VLSI Design 1996: 426-431 - 1995
- [c24]Mandyam-Komar Srinivas, Vishwani D. Agrawal, Michael L. Bushnell:
Functional test generation for path delay faults. Asian Test Symposium 1995: 339-345 - [c23]James Sienicki, Michael L. Bushnell, Prathima Agrawal, Vishwani D. Agrawal:
An adaptive distributed algorithm for sequential circuit test generation. EURO-DAC 1995: 236-241 - [c22]Marwan A. Gharaybeh, Michael L. Bushnell, Vishwani D. Agrawal:
Classification and Test Generation for Path-Delay Faults Using Single Stuck-Fault Tests. ITC 1995: 139-148 - [c21]James Sienicki, Michael L. Bushnell, Prathima Agrawal, Vishwani D. Agrawal:
An asynchronous algorithm for sequential circuit test generation on a network of workstations. VLSI Design 1995: 36-41 - [c20]Xinghao Chen, Michael L. Bushnell:
Generation of search state equivalence for automatic test pattern generation. VLSI Design 1995: 99-103 - [c19]Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell:
Statistical methods for delay fault coverage analysis. VLSI Design 1995: 166-170 - [c18]Imtiaz P. Shaik, Michael L. Bushnell:
A graph approach to DFT hardware placement for robust delay fault BIST. VLSI Design 1995: 177-182 - [c17]Imtiaz P. Shaik, Michael L. Bushnell:
Circuit design for low overhead delay-fault BIST using constrained quadratic 0-1 programming . VTS 1995: 393-399 - 1994
- [c16]Keerthi Heragu, Michael L. Bushnell, Vishwani D. Agrawal:
An Efficient Path Delay Fault Coverage Estimator. DAC 1994: 516-521 - [c15]Sandip Parikh, Michael L. Bushnell, James Sienicki, Ganesh Ramakrishnan:
Distributed Computing, Automatic Design, and Error Recovery in the ULYSSES II Framework. EDAC-ETC-EUROASIC 1994: 610-617 - [c14]Xinghao Chen, Michael L. Bushnell:
Dynamic State and Objective Learning for Sequential Circuit Automatic Test Generation Using Decomposition Equivalence. FTCS 1994: 446-455 - [c13]James Sienicki, Michael L. Bushnell, Sandip Parikh:
Graphical Methodology Language for CAD Frameworks. VLSI Design 1994: 401-406 - [c12]Carolina L. C. Cooper, Michael L. Bushnell:
Neural models for transistor and mixed-level test generation. VTS 1994: 208-213 - [c11]Keerthi Heragu, Vishwani D. Agrawal, Michael L. Bushnell:
FACTS: fault coverage estimation by test vector sampling. VTS 1994: 266-271 - 1993
- [c10]Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Design for Testability for Path Delay faults in Sequential Circuits. DAC 1993: 453-457 - 1992
- [c9]Tapan J. Chakraborty, Vishwani D. Agrawal, Michael L. Bushnell:
Delay Fault Models and Test Generation for Random Logic Sequential Circuits. DAC 1992: 165-172 - 1991
- [c8]John Giraldi, Michael L. Bushnell:
Search State Equivalence for Redundancy Identification and Test Generation. ITC 1991: 184-193 - 1990
- [c7]Daniel R. Brasen, Michael L. Bushnell:
MHERTZ: A New Optimization Algorithm for Floorplanning and Global Routing. DAC 1990: 107-110 - [c6]Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell:
Automatic Test Generation Using Quadratic 0-1 Programming. DAC 1990: 654-659 - [c5]John Giraldi, Michael L. Bushnell:
EST: The New Frontier in Automatic Test-Pattern Generation. DAC 1990: 667-672 - [c4]Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell:
Polynomial time solvable fault detection problems. FTCS 1990: 56-63 - 1988
- [c3]Xinghao Chen, Michael L. Bushnell:
A Module Area Estimator for VLSI Layout. DAC 1988: 54-59 - [c2]Srimat T. Chakradhar, Michael L. Bushnell, Vishwani D. Agrawal:
Automatic test generation using neural networks. ICCAD 1988: 416-419 - 1986
- [c1]Michael L. Bushnell, Stephen W. Director:
VLSI CAD tool integration using the Ulysses environment. DAC 1986: 55-61
Coauthor Index
[j26] [j25] [j24] [j23] [j22] [j21] [j20] [j17] [j16] [j15] [j13] [j12] [j11] [j9] [j8] [j6] [j5] [c69] [c67] [c53] [c52] [c51] [c49] [c48] [c47] [c46] [c45] [c44] [c43] [c42] [c41] [c38] [c37] [c36] [c35] [c34] [c32] [c30] [c29] [c28] [c26] [c25] [c24] [c23] [c22] [c21] [c19] [c16] [c11] [c10] [c9] [c6] [c4] [c2]
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